Takahashi K., Shiohara Y., Yamada Y., Miyata S., Kuriki R., Ibi A.(ibi@istec.or.jp), Fukushima H.
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, crack formation, Jc/B curves, thickness dependence, fabrication, critical caracteristics
Christen D.K., Hawsey R.A.(hawseyra@ornl.gov)
Teranishi R., Fuji H., Aoki Y., Izumi T.(izumi@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Nomoto S.
Ключевые слова: HTS, coated conductors, TFA-MOD process, long conductors, review, YBCO, critical current, thickness dependence, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Fuji H., Izumi T., Shiohara Y., Miyata S., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Nomoto S., Matuda J.
Takahashi K., Muroga T., Shiohara Y., Yamada Y., Miyata S., Ibi A., Kobayashi H., Konishi M.(masaya-konishi@istec.or.jp)
Pomar A., Rousseau B.(benoit.rousseau@cnrs-orleans.fr), Canizares A., Veron E., Ramy-Ratiarison R., Blin A., Meneses D.D., Simon P., Berberich F., Graafsma H.
Ключевые слова: HTS, YBCO, chemical solution deposition, substrate LaAlO3, films epitaxial, measurement technique, thickness dependence, porosity
Develos-Bagarinao K.(kathy@ni.aist.go.jp), Yamasaki H., Nakagawa Y., Nie J.C.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Muroga T., Kiss T., Shiohara Y., Watanabe T., Watanabe T., Otabe E.S., Kiuchi M., Fukumoto Y., Yamada Y., Miyata S., Yamauchi K., Matsushita T.(matusita@cse.kyutech.ac.jp), Ibi A.
Aoki Y., Shiohara Y.(shiohara@istec.or.jp)
Takahashi K., Muroga T., Shiohara Y., Watanabe T., Yamada Y., Iwai H., Miyata S., Ibi A.(ibi@istec.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, texture, critical current, substrate Hastelloy, thickness dependence, fabrication, critical caracteristics
Kiuchi M., Wada H., Matsushita T.(matusita@cse.kyutech.ac.jp), Yasuda T., Uchiyama T., Iguchi I.
Yamasaki H., Nakagawa Y., Nie J.C., Murugesan M., Mawatari Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp)
Muroga T., Shiohara Y., Kiuchi M., Yamada Y., Miyata S., Matsushita T.(matusita@cse.kyutech.ac.jp), Ibi A., Kimura K.
Arendt P.N., Foltyn S.R., Jia Q.X., Li Y., Zhang X., Wang H.(wangh@lanl.gov)
Barnes P.N., Haugan T.J., Wu J.Z., Emergo R.L.(remergo@ku.edu)
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